LEM SATURN 100 plus Instrucciones De Uso página 55

Information for the tester
Nominal Measuring range
Resolution
current for R S and R A,
I ∆N (mA)
respectively
10 1...15 Ω...9,99 kΩ 1...10
30 1...10
1...15 Ω...3,33 kΩ
100 0,1...1,5 Ω...999 Ω 0,1...1
3 ) 300 0,1...1,5 Ω...333 Ω 0,1...1
1 ) 500 0,01...0,15 Ω...199 Ω 0,01...1
1 ) 2 )1000 0,01..0,15 Ω..9,9Ω 0,01...1
1
) not with U < 152 V, not for 5 x I
L-PE ∆ N
2
) not for S and 5 x I
∆ N
3
) not for 5 x I
∆ N
4
) can be changed to R=U /2xI at the service centre
L ∆ N
Tripping Time
Test Resolution
Range (t A
0 ... 500 ms 1 ms
I x 1,
∆ N
I x 2, S
∆ N
150 ms 1 ms
I x 5
∆ N
Ramp 300/500 ms 1 ms
Measuring time with
tripping test: 2 - 26 cycles + (250 + 200) ms
(response time of FI-switch)
with probe:
Probe Voltage Range Resolution
0,1 – 69,9 V 0,1 V
Internal resistance: approx. 1,6 MΩ
≤ 10 kΩ
Max. probe resistance:
Noise voltage: max. 20 V with respect to PE-potential;
at higher probe voltages no measurement is started.
Operational
Calculation
intrinsic error
(Ω)
U L
R A ( R S) =
2x I ∆N
S
at :
U L
±(10%v.MW+4 D)
R A ( R S) =
I ∆N
Intrinsic error
±4 ms
±4 ms
±4 ms
Intrinsic error
± (2 % of m.v. digits)
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