Aim TTi LCR400 Manual De Instrucciones página 17

Overlap Sorting
Overlap sorting is used when components are to be sorted into bins according to their deviation
from a nominal value, for example sorting a particular resistor value into ± 0.1%, ± 0.5% and
± 1% selections.
To set up this type of binning first select the measurement type to be made, e.g. R + Q, set the
measurement frequency and select series or parallel mode as required.
Select bin 0 and set the nominal value and tightest tolerance to be selected (i.e. 0.1% in the case
of the example) using the Nominal and Limit keys exactly as described for simple pass/fail
testing. Note that, since the limits are symmetrical, it is only necessary to set
is 'closed' (dashes shown in the display) the lower limit is automatically –0.1%.
–LIM
Next select bin 1 in a similar way to bin 0 and set its limits to the next tightest tolerance (i.e. 0.5%
for the example). In the same way as for bin 0 it is only necessary to set
will default to –0.5% if no limit is set. Also note that it is not necessary to set a nominal
–LIM
for bin 1 (and any successive bins that use the same nominal); if the nominal is left 'closed'
(dashes shown in the display) the nominal of the next lower bin, in this case bin 0, is
automatically used. Note that if bin 0 does not have a nominal value and limits, selecting Sort will
cause the display to show the message
Set the +LIM
Set the minor term limit (Q in the case of R + Q measurements) in bin 8 if required; bin 8 is
ignored if the limit is 'closed' (dashes shown in the display).
Parts that fall into more than one bin are assigned to the lower numbered bin, Thus the tightest
tolerances should be assigned to the lowest bin number, as in the example.
Unused bins should be 'closed' (indicated by dashes) by using the clear bin function.
Parts that do not fall into the pass bins or bin 8 are assigned to bin 9, the general fail bin.
Sequential Sorting
Sequential sorting with the same nominal can be set up in essentially the same way as for
overlap sorting, with a nominal value only defined for bin 0. However, every bin will need both
upper (
+LIM
the bands –2% to –1%, ± 1%, and +1% to +2%, bin 0 has its
value, +LIM
set to +1% and its
is set to +1%.
–LIM
Sequential sorting with different nominals can again be set up in essentially the same way but
this time every bin has
nominal are symmetric then only
will also need to be set.
In both schemes bin 8 can be set with the limit for the minor term, if required, exactly as
described previously.
Any parts that do not fall into the pass bins or bin 8, including any 'gaps' between the limits of the
sequential bins are assigned to bin 9, the general failure bin.
Storing and Recalling Sort Set–ups
Set–ups for multi–bin sorting are stored and recalled from non–volatile memory exactly as
described for simple pass/fail sorting.
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limit of bin 2 to 1% to complete the example given.
) and lower (
–LIM)
set to –1% and –LIM
to –1%; bin 2 has no
–LIM
NOM set to its respective nominal. If the limits associated with each
+LIM
.
Err bin0
limits defined. For example, to sort a particular resistor into
set to –2%; bin 1 has no
either, its
NOM
need be set, but if they are asymmetric then
+LIM
+LIM
NOM set to the nominal resistor
NOM value and its
is set to +2% and its
+LIM
to 0.1%; if
to 0.5%;
+LIM is
–LIM