Replacement Parts - Ingun SB-SI-170-4A Serie Manual Del Usuario

receptacle can then be removed without damaging the mounting hole.
Extraction tool for receptacles
7.3) Cleaning test probes
Test probes can be cleaned with commercially available, soft plastic or glass fibre brush or clean-
ing mats to remove severe contamination.
ATTENTION P
OSSIBLE DAMAGE TO PROPERTY
High radial forces can lead to deformation of the probe.
Ensure no side forces act on the test probes during the cleaning process!

NOTE W
EAR OF PLATING
Manual cleaning of the test probe plunger tips has a slightly abrasive effect on the outer plating.
Repeated cleaning of tips can lead to removal of the conductive plating, which impairs the electri-
cal performance. However, keeping plunger tips free from contamination will ultimately ensure re-
liable test results and improve the life expectancy of the probe.
Remove loosened dirt particles from the working area using vacuum or suction after cleaning.
7.4)

Replacement parts

Please refer to the catalogue for INGUN interface blocks for the respective test probes to be used.
19
1) Stop
2) Weight
3) Compression spring
4) Adapter
5) Threaded pin
6) Insert (bit)
7) Probe plate
8) Receptacle
!
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INGUN, errors and technical changes reserved
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