Tripping Test / Test De Déclenchement / Prueba De Disparo / Auslösetest / Test Di Intervento / Teste De Disparo / Тест Отключения / 脱扣测试; Micrologic 2.2: Trip Unit Adjustment / Réglages Du Déclencheur / Ajuste De La Unidad De Control / Anpassung Des Auslösesystems / Regolazione Dell'unità Di Sgancio - Compact NSX100-250 Manual Del Usuario

5
Tripping Test / Test de déclenchement / Prueba de disparo / Auslösetest / Test di intervento /
Teste de disparo / Тест отключения / 脱扣测试
1
Tr ip
OFF
reset
6
MicroLogic 2.2: Trip Unit Adjustment / Réglages du déclencheur / Ajuste de la unidad de
control / Anpassung des Auslösesystems / Regolazione dell'unità di sgancio / Ajuste da
unidade de disparo / Регулировка размыкателя / 脱扣单元整定
Ir, Isd
In 100 A
1
Io 63
2 40 45 50 55
Ir
3 .9 .92 .93 .94 .95
Ir = 63 x 0.95 = 59.9 A
Isd
4
1.5 2 3 4 5
Isd = 59.9 x 5 = 299 A
ON
Tr ip
1
T ri p
Isd 5 6
4 7
Ir
.95 .96
>1 05 % 3
.94 8
>9 0 % .97
Io 16 0 17 5 2
Ir 10
14 0 20 0 .93
.98 1.5
12 5 22 5 .92 1 xIr
.9
11 0
25 0
10 0 xIo
(A )
2
3
3P/4P
1 In
40/100A
63
55 70
50 80
45 90
40 100
2 Io 3 Ir 4 Isd
t
70 80 90 100
(A)
.96 .97 .98 1
(x Io)
6 7 8 10 (x Ir)
0
ComPacT NSX100-630
User Guide
2
Tr ip
3
T ri p
Isd 5 6
4
Ir
.95 .96
>1 05 % 3 8
% .94 .97
>9 0 16 0 17 5
Io 2
Ir .93 10
14 0 20 0 .98
1.5
12 5 .92 1 xIr
22 5
.9
11 0
25 0
xIo
10 0
(A )
1500
4P 3D
Ir = x
2 3
3D + N/2
(Io x .9 ... 1)
4P 4D
Isd = Ir x
4
(Ir x 1.5 ... 10)
I
NNZ4765207-00 9/12
Is d
5 6
4
7
Ir .9 5 .9 6
% 3
>1 05
.9 4 8
% .9 7
>9 0
Io 16 0 17 5 2
Ir .9 3 10
14 0 .9 8
20 0 1. 5
.9 2
12 5 1 xI r
22 5
.9
11 0
25 0
xI o
10 0
(A )
4
7
4P
63
55
50
45
40
N
N
OFF
Ir/2
Ir
DOCA0187EN
DOCA0187FR
DOCA0187ES
DOCA0187ZH
Clack!
Tripped
Tr ip
40/100A
1500
70
80
90
100