BEHA Unitest TELARIS Fi/RCD Manual De Instrucciones página 50

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Technical Data
Table 4 Trip times for selective RCB´s
Fi/RCD-Type
Current Type
Current Type
I∆N
I∆N
x0.5
x1
100mA/
x2
300mA/
x5
500mA/
x0.5
1000mA
x1
x2
x5
x0.5
x1
x2
x5
Table 5 Trip times for RCB´s with over curent protection
Fi/RCD-Type
Current Type
Current Type Test Current prescribed Test Time
I∆N
I∆N
x0.5
x1
10mA/
x2
30mA/
x5
100mA/
Ramp
300mA/
x0.5
500mA/
x1
1000mA
x2
x5
Ramp
x0.5
x1
x2
x5
Ramp
50
Test Current
prescribed
Test Time
I∆N
Trip Time
0.5x
-
500ms
1x
500ms
130...500ms
2x
200ms
60...200ms
5x
150ms
50...150ms
0.35x
-
500ms
1.4x
500ms
130...500ms
2.8x
200ms
60...200ms
7x
150ms
50...150ms
0.5x
-
500ms
2x
500ms
< 500ms
4x
200ms
< 200ms
10x
150ms
< 150ms
I∆N
Trip Time
0.5x
-
2000ms, I∆N≥100mA: 500ms
1x
<300ms
500ms
2x
<150ms
150ms
5x
<40ms
40ms
0.4x- 1.4x
<300ms
300ms
0.35x
-
2000ms, I∆N≥100mA: 500ms
1.4x
<300ms
500ms
2.8x
<150ms
150ms
7x
<40ms
40ms
0.1x- 1.4x
<300ms
300ms
0.5x
-
2000ms, I∆N≥100mA: 500ms
2x
<300ms
500ms
4x
<150ms
150ms
10x
<40ms
40ms
0.1x- 2x
<300ms
300ms
Standard
Fi/RCD
Analyzer
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
0664- Teil100 √
0664- Teil100 √
0664- Teil100 √
0664- Teil100 √
Standard
Fi/RCD
Analyzer
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1

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Unitest 9061

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