BEHA Unitest TELARIS Fi/RCD Manual De Instrucciones página 51

Table 6 Trip times for selective RCB´s with over curent protection
Fi/RCD-Type Current Type Current Type
I∆N
I∆N
x0.5
(RCBO) x1
(100mA/ x2
300mA/ x5
500mA/ x0.5
1000mA) x1
x2
x5
x0.5
x1
x2
x5
Table 7 Trip times for impulse resistent RCB´s
Fi/RCD-Type Current Type Current Type
I∆N
x0.5
x1
10mA/ x2
30mA/ x5
100mA/ Ramp
300mA/ x0.5
500mA/ x1
1000mA x2
x5
Ramp
x0.5
x1
x2
x5
Ramp
Test Current prescribed Test Time
I∆N Trip Time
0.5x - 500ms
1x 130...500ms 500ms
2x 60...200ms 200ms
5x 50...150ms 150ms
0.35x - 500ms
1.4x 130...500ms 500ms
2.8x 60...200ms 200ms
7x 50...150ms 150ms
0.5x - 500ms
2x <500ms 500ms
4x <200ms 200ms
10x <150ms 150ms
Test Current prescribed Test Time
I∆N Trip Time
0.5x -
2000ms, I∆N≥100mA: 500ms
1x 10...300ms 500ms
2x 10...150ms 150ms
5x 10...40ms 40ms
0.4x- 1.4x 10...200ms 200ms
0.35x -
2000ms, I∆N≥100mA: 500ms
1.4x 10...300ms 500ms
2.8x 10...150ms 150ms
7x 10...40ms 40ms
0.1x- 1.4x 10...300ms 200ms
0.5x -
2000ms, I∆N≥100mA: 500ms
1x 10...300ms 500ms
2x 10...150ms 150ms
5x 10...40ms 40ms
0.1x- 1.4x 10...300ms 200ms
Technical Data
Standard Fi/RCD
Analyzer
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
IEC61009-1
√
√
√
√
Standard Fi/RCD
Analyzer
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
IEC61008-1
√
√
√
√
√
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