Summary Tabs
Alarm Summary
Test
Global: Indicates the presence of any alarms/errors related to the test
such as Port, OTN, SONET/SDH, DSn/PDH, Next Generation, Pattern,
and Other.
Log Full: Indicates that the logger reched it maximum capacity of 5000
events.
Configuration: Indicates the test structure (data path).
Port: Indicates the presence of any alarms/errors related to the
physical port such as LOS, Frequency, LOC, and Code Errors (for
electrical port: BPV, EXZ, or CV errors). Also indicates the port power
measurement Power (dBm) and Range (dBm) for optical port,
frequency Freq (bps), and Offset (ppm). For Dual RX test case, the
measurement are available for both the Main (test port) and AUX ports.
Refer to Port Tabs on page 137 for more information.
OTN: Indicates the presence of any alarms/errors related to the OTN
such as OTU, ODU (includes ODU TCM alarms), and OPU. Refer to
OTN Tabs on page 153 for more information.
SONET/SDH: Indicates the presence of any alarms/errors related to
SONET/SDH testing such as Section/RS, Line/MS, HOP (High Order
Path), and LOP (Low Order Path). LOP is not suppoted on the
FTB-8140. Refer to SONET Tabs on page 211 and SDH Tabs on page 303
for more information.
Next Generation: Indicates the presence of any alarms/errors related
to Next Generation testing such as VCAT, LCAS, GFP , and Link. Refer to
Next-Generation Tabs on page 429 for more information.
DSn/PDH: Indicates the presence of any alarms/errors related to
DSn/PDH testing such as DS1/1.5M, DS3/45M, E1/2M, E2/8M, E3/34M,
and E4/140M. Not suppoted on the FTB-8140. Refer to DSn Tabs on
page 269 and PDH Tabs on page 369 for more information.
133
SONET/SDH Application